검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Phase stepping microscopy for layer thickness measurement in silicon-on-insulator structures Martin E, Sanz LF, Jimenez J, Perez-Rodriguez A, Morante JR, Aspar B, Margail J Thin Solid Films, 311(1-2), 225, 1997 |
| 2 |
Silicon-on-Insulator Obtained by High-Dose Oxygen Implantation, Microstructure, and Formation Mechanism Stoemenos J, Garcia A, Aspar B, Margail J Journal of the Electrochemical Society, 142(4), 1248, 1995 |