검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Charge Trapping and Interface State Generation in Rapid Thermal Processed Oxide and Nitrided-Oxide MOS Capacitors by Electron Photoinjection from Al Gate and Si Substrate Yuan XJ, Marsland JS, Eccleston W, Bouvet D, Mi J, Dutoit M Journal of the Electrochemical Society, 142(3), 1021, 1995 |