검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Use of SIMS in SiGe process control Maul JL, Chou PF, Lu YH Applied Surface Science, 231-2, 713, 2004 |
| 2 |
Charge compensation using optical conductivity enhancement and simple analytical protocols for SIMS of resistive Si1-xGex alloy layers Dowsett MG, Morris R, Chou PF, Corcoran SF, Kheyrandish H, Cooke GA, Maul JL, Patel SB Applied Surface Science, 203, 500, 2003 |