화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Dopant dose loss at the Si-SiO2 interface
Vuong HH, Rafferty CS, Eshraghi SA, Ning J, McMacken JR, Chaudhry S, McKinley J, Stevie FA
Journal of Vacuum Science & Technology B, 18(1), 428, 2000
2 Nitrogen incorporation and trace element analysis of nanocrystalline diamond thin films by secondary ion mass spectrometry
Zhou D, Stevie FA, Chow L, McKinley J, Gnaser H, Desai VH
Journal of Vacuum Science & Technology A, 17(4), 1135, 1999
3 Hydrogen-Based Microbial Ecosystems in the Earth - Reply
Stevens T, Mckinley J
Science, 272(5263), 896, 1996