검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Ballistic-Electron-Emission Microscopy Studies of Electron-Scattering in Au/GaAs Schottky Diodes Damaged by Focused Ion-Beam Implantation Mcnabb JW, Craighead HG Journal of Vacuum Science & Technology B, 14(2), 617, 1996 |
| 2 |
Reduced Electron Transmission in Au/GaAs Diodes Damaged by Focused Ion-Beam Implantation Studied by Ballistic-Electron-Emission Microscopy Mcnabb JW, Skvarla M, Craighead HG Journal of Vacuum Science & Technology B, 12(6), 3712, 1994 |