화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Reducing the pattern redundancy in optical proximity correction modeling by analyzing the pattern linearity
Li JL, Zhang L, Yan QL, Melvin LS, Lin C, Su E, Tang N
Journal of Vacuum Science & Technology B, 28(6), C6J19, 2010
2 Model based optical proximity correction runtime saving with multisegment solver
Li JL, Li XH, Deeth S, Lugg R, Melvin LS
Journal of Vacuum Science & Technology B, 27(6), 2972, 2009
3 Transferring optical proximity correction effects into a process model
Li JL, Yan QL, Melvin LS
Journal of Vacuum Science & Technology B, 26(5), 1808, 2008
4 Abbe singular-value decomposition: Compact Abbe's kernel generation for microlithography aerial image simulation using singular-value decomposition method
Chen CCP, Gurhanli A, Chiang TY, Hong JJ, Melvin LS
Journal of Vacuum Science & Technology B, 26(6), 2322, 2008
5 Exploration of etch step interactions in the dual patterning process for process modeling
Melvin LS, Ward BS, Song H, Rhie SU, Lucas KD, Wiaux V, Verhaegen S, Maenhoudt M
Journal of Vacuum Science & Technology B, 26(6), 2434, 2008
6 Study of the assist features effect on the through focus behavior in isoline with an innovative method
Li JL, Yan QL, Melvin LS
Journal of Vacuum Science & Technology B, 25(6), 2301, 2007
7 Generation of isofocal target patterns using process modeling during optical proximity correction
Melvin LS, Croffie E, Biswas A
Journal of Vacuum Science & Technology B, 24(6), 2815, 2006
8 Use of optical defocus components to investigate and improve pattern spatial frequency characteristics for more robust layouts
Melvin LS, Shiely JP, Yan QL
Journal of Vacuum Science & Technology B, 23(6), 2631, 2005