검색결과 : 12건
No. | Article |
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1 |
Sample Preparation: Error Source Number 1 in Particle Size Analysis Merkus HG Particulate Science and Technology, 28(5), 394, 2010 |
2 |
Sampling errors in particle size analysis? Merkus HG Particle & Particle Systems Characterization, 24(1), 34, 2007 |
3 |
On-line measurement of particle size and shape using laser diffraction Ma ZH, Merkus HG, van der Veen HG, Wong M, Searlett B Particle & Particle Systems Characterization, 18(5-6), 243, 2002 |
4 |
In-line particle size measurement for control of jet milling Ma ZH, van der Veen H, Merkus HG, Scarlett B Particle & Particle Systems Characterization, 18(2), 99, 2001 |
5 |
Extending laser diffraction for particle shape characterization: technical aspects and application Ma ZH, Merkus HG, Scarlett B Powder Technology, 118(1-2), 180, 2001 |
6 |
New developments in particle characterization by laser diffraction: size and shape Ma ZH, Merkus HG, de Smet JGAE, Heffels C, Scarlett B Powder Technology, 111(1-2), 66, 2000 |
7 |
Improving the sensitivity of forward light scattering technique to large particles Ma ZH, Merkus HG, de Smet JGAE, Verheijen PJT, Scarlett B Particle & Particle Systems Characterization, 16(2), 71, 1999 |
8 |
Monitoring the dynamics of concentrated suspensions by enhanced backward light scattering Spicer PT, Pratsinis SE, Willemse AW, Merkus HG, Scarlett B Particle & Particle Systems Characterization, 16(5), 201, 1999 |
9 |
Development of a heterodyne photon correlation spectroscopy measuring probe for highly concentrated dispersions Willemse AW, Merkus HG, Scarlett B Journal of Colloid and Interface Science, 204(2), 247, 1998 |
10 |
Proposals of a procedure for mass recovery of standard materials: Comparison between two electrical sensing zone instruments Bonferoni MC, Ciocca C, Merkus HG, Caramella C Particle & Particle Systems Characterization, 15(4), 174, 1998 |