검색결과 : 2건
No. | Article |
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1 |
Circuit model for single-energy-level trap centers in FETs Albahrani SA, Parker A, Heimlich M Solid-State Electronics, 126, 143, 2016 |
2 |
Physical modeling of off-state breakdown in power GaAs MESFETs Kunihiro K, Takahashi Y, Ohno Y Solid-State Electronics, 47(4), 621, 2003 |