검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures Giannazzo F, Raineri V, Mirabella S, Impellizzeri G, Priolo F, Fedele M, Mucciato R Journal of Vacuum Science & Technology B, 24(1), 370, 2006 |
| 2 |
Detailed thermal boundary conditions in the 3D fluid-dynamic modelling of horizontal MOVPE reactors Mucciato R, Lovergine N Journal of Crystal Growth, 221, 758, 2000 |