| 1 |
Frequency dependent Kelvin probe force microscopy on silicon surfaces
Muller F, Muller AD
Journal of Vacuum Science & Technology B, 27(2), 969, 2009 |
| 2 |
Mesoscopic temporary devices: a multiple tip experiment on a silicon surface
Muller AD, Muller F, Hietschold M, Gessner T
Current Applied Physics, 5(6), 629, 2005 |
| 3 |
Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina
Muller F, Muller AD, Schulze S, Hietschold M
Journal of Materials Science, 39(9), 3199, 2004 |
| 4 |
Highly resolved electric force microscopy of metal-filled anodic alumina
Muller F, Muller AD, Kroll M, Schmid G
Applied Surface Science, 171(1-2), 125, 2001 |
| 5 |
Localized electrochemical deposition of metals using micropipettes
Muller AD, Muller F, Hietschold M
Thin Solid Films, 366(1-2), 32, 2000 |
| 6 |
Electron-Beam-Induced Oxidation of Indium Particles Embedded in a Plasma Polymer Thin-Film Matrix
Muller AD, Heilmann A, Muller F
Thin Solid Films, 281-282, 112, 1996 |
| 7 |
Electron-Beam Initiated Oxidation and Coalescence of Metal Particles Embedded in a Plasma-Polymer Thin-Film Matrix
Heilmann A, Muller AD, Werner J, Muller F
Thin Solid Films, 270(1-2), 351, 1995 |
