검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography Hruszkewycz SO, Allain M, Holt MV, Murray CE, Holt JR, Fuoss PH, Chamard V Nature Materials, 16(2), 244, 2017 |
| 2 |
Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements Murray CE, Polvino SM, Noyan IC, Cai Z, Maser J, Holt M Thin Solid Films, 530, 85, 2013 |
| 3 |
High-mobility p-type transistor based on a spin-coated metal telluride semiconductor Mitzi DB, Copel M, Murray CE Advanced Materials, 18(18), 2448, 2006 |
| 4 |
Underlayer effects on texture evolution in copper films Murray CE, Rodbell KP, Vereecken PM Thin Solid Films, 503(1-2), 207, 2006 |
| 5 |
Mechanics of end effects in thin film and substrate stress distributions Murray CE, Noyan IC Materials Science Forum, 490-491, 13, 2005 |