1 |
Phase separation within NiSiN coatings during reactive HiPIMS discharges: A new pathway to grow NixSi nanocrystals composites at low temperature Keraudy J, Boyd RD, Shimizu T, Helmersson U, Jouan PY Applied Surface Science, 454, 148, 2018 |
2 |
Solid-phase diffusion controlled growth of nickel silicide nanowires for supercapacitor electrode Ramly MM, Omar FS, Rohaizad A, Aspanut Z, Rahman SA, Goh BT Applied Surface Science, 456, 515, 2018 |
3 |
Effects of substrate temperature on the growth, structural and optical properties of NiSi/SiC core-shell nanowires Hamzan NB, Nordin FNB, Rahman SA, Huang NM, Goh BT Applied Surface Science, 343, 70, 2015 |
4 |
The effects of grain boundary scattering on electrical resistivity of Ag/NiSi suicide films formed on silicon substrate at 500 degrees C by RTA Utlu G, Artunc N Applied Surface Science, 310, 248, 2014 |
5 |
Microstructure, crystallization kinetics and recording characteristics of Si/NiSi bilayer for write-once blu-ray disk Ou SL, Chen SC, Lin YC, Kuo TY Thin Solid Films, 570, 486, 2014 |
6 |
High-density NiSi nanocrystals embedded in Al2O3/SiO2 double-barrier for robust retention of nonvolatile memory Ren JL, Li B, Zheng JG, Liu JL Solid-State Electronics, 67(1), 23, 2012 |
7 |
20 nm Gate length Schottky MOSFETs with ultra-thin NiSi/epitaxial NiSi2 source/drain Knoll L, Zhao QT, Luptak R, Trellenkamp S, Bourdelle KK, Mantl S Solid-State Electronics, 71, 88, 2012 |
8 |
Enhanced formation of periodic arrays of low-resistivity NiSi nanocontacts on (001)Si0.7Ge0.3 by nanosphere lithography with a thin interposing Si layer Cheng SL, Zhan CY, Lee SW, Chen H Applied Surface Science, 257(20), 8712, 2011 |
9 |
NiSi 접촉과 Cu 플러그/Ti 확산방지층의 동시 형성 연구 배규식 Korean Journal of Materials Research, 20(6), 338, 2010 |
10 |
Systematic study of Schottky barrier MOSFETs with dopant segregation on thin-body SOI Urban C, Sandow C, Zhao QT, Knoch J, Lenk S, Mantl S Solid-State Electronics, 54(2), 185, 2010 |