검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Improved properties of Pt-HfO2 gate insulator-ZnO semiconductor thin film structure by annealing of ZnO layer Na KD, Kim JH, Park TJ, Song J, Hwang CS, Choi JH Thin Solid Films, 518(18), 5326, 2010 |
| 2 |
First-principles study on the formation of a vacancy in Ge under biaxial compressive strain Choi JH, Na KD, Lee SC, Hwang CS Thin Solid Films, 518(22), 6373, 2010 |
| 3 |
Role of Carbon on Resistivity and Structure of HfCxNy Films Grown by Low Temperature MOCVD Jang JH, Park TJ, Kim JH, Na KD, Park WY, Kim M, Hwang CS Journal of the Electrochemical Society, 156(1), H76, 2009 |
| 4 |
Reduced Electrical Defects and Improved Reliability of Atomic-Layer-Deposited HfO2 Dielectric Films by In Situ NH3 Injection Kim JH, Park TJ, Cho M, Jang JH, Seo M, Na KD, Hwang CS, Won JY Journal of the Electrochemical Society, 156(5), G48, 2009 |
| 5 |
Influence of phase separation on electrical properties of ALD Hf-silicate films with various Si concentrations Park TJ, Kim JH, Jang JH, Na KD, Hwang CS, Yoo JH Electrochemical and Solid State Letters, 11(5), H121, 2008 |
| 6 |
Comparison of electrical properties between HfO2 films on strained and relaxed Si1-xGex substrates Park TJ, Kim JH, Jang JH, Na KD, Seo M, Hwang CS, Won JY Electrochemical and Solid State Letters, 10(12), G97, 2007 |