검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Resist charging effect in photomask: Its impact on pattern placement error and critical dimension Choi J, Nam DS, Kim BG, Woo SG, Cho HK Journal of Vacuum Science & Technology B, 26(6), 2345, 2008 |
| 2 |
Automatic Construction of Extended Symptom-Fault Associations from the Signed Digraph Nam DS, Han C, Jeong CW, Yoon ES Computers & Chemical Engineering, 20(S), 605, 1996 |
| 3 |
Operation-Aided System for Fault-Diagnosis of Continuous and Semicontinuous Processes Nam DS, Jeong CW, Choe YJ, Yoon ES Computers & Chemical Engineering, 20(6-7), 793, 1996 |
| 4 |
AUTOMATIC GENERATION OF THE SYMPTOM TREE MODEL FOR PROCESS FAULT DIAGNOSIS Nam DS, Choe YJ, Yoon YH, Yoon ES Korean Journal of Chemical Engineering, 10(1), 28, 1993 |