| 1 |
Comparison of memory effect with voltage or current charging pulse bias in MIS structures based on codoped Si-NCs embedded in SiO2 or HfOx
Mazurak A, Mroczynski R
Solid-State Electronics, 159, 157, 2019 |
| 2 |
Effects of charge storage dielectric thickness on hybrid gadolinium oxide nanocrystal and charge trapping nonvolatile memory
Wang JC, Lin CT, Chang CF
Current Applied Physics, 14(3), 232, 2014 |
| 3 |
High-density NiSi nanocrystals embedded in Al2O3/SiO2 double-barrier for robust retention of nonvolatile memory
Ren JL, Li B, Zheng JG, Liu JL
Solid-State Electronics, 67(1), 23, 2012 |
| 4 |
Metal nanocrystal memory with sol-gel derived HfO2 high-kappa tunnel oxide
Leu CC, Chen ST, Liu FK
Thin Solid Films, 519(16), 5629, 2011 |
| 5 |
Retention modeling of nanocrystalline flash memories: A Monte Carlo approach
Ghosh B, Liu H, Winstead B, Foisy MC, Banerjee SK
Solid-State Electronics, 54(11), 1295, 2010 |
| 6 |
On the electrostatic behavior of floating nanoconductors
Deleruyelle D, Micolau G
Solid-State Electronics, 52(1), 17, 2008 |
| 7 |
Charge storage characteristics of metal-induced nanocrystalline in erbium-doped amorphous silicon films
Li ZG, Guan WH, Liu M, Long SB, Jia R, Lv J, Shi Y, Zhao XW
Thin Solid Films, 516(21), 7657, 2008 |
| 8 |
Modeling of retention characteristics for metal and semiconductor nanocrystal memories
Guan WH, Long SB, Liu M, Liu Q, Hu Y, Li ZG, Jia R
Solid-State Electronics, 51(5), 806, 2007 |
| 9 |
Parasitic memory effects in shallow-trench-isolated nanocrystal memory devices
Dimitrakis P, Normand P
Solid-State Electronics, 51(1), 147, 2007 |
| 10 |
Charge storage in a metal-oxide-semiconductor capacitor containing cobalt nanocrystals
Zhao DT, Zhu Y, Liu JL
Solid-State Electronics, 50(2), 268, 2006 |
