화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 Self-aligned two-layer metallization with low series resistance for litho-less contacting of large-area photodiodes
Mok KRC, Qi L, Vlooswijk AHG, Nanver LK
Solid-State Electronics, 111, 210, 2015
2 Aluminum-induced iso-epitaxy of silicon for low-temperature fabrication of centimeter-large p(+)n junctions
Sakic A, Qi L, Scholtes TLM, van der Cingel J, Nanver LK
Solid-State Electronics, 84, 65, 2013
3 PureGaB p(+)n Ge diodes grown in large windows to Si with a sub-300 nm transition region
Sammak A, Qi L, de Boer WB, Nanver LK
Solid-State Electronics, 74, 126, 2012
4 Integration of MOSFETs with SiGe dots as stressor material
Nanver LK, Jovanovic V, Biasotto C, Moers J, Grutzmacher D, Zhang JJ, Hrauda N, Stoffel M, Pezzoli F, Schmidt OG, Miglio L, Kosina H, Marzegalli A, Vastola G, Mussler G, Stangl J, Bauer G, van der Cingel J, Bonera E
Solid-State Electronics, 60(1), 75, 2011
5 Boron-layer silicon photodiodes for high-efficiency low-energy electron detection
Sakic A, Nanver LK, Scholtes TLM, Heerkens CTH, Knezevic T, van Veen G, Kooijman K, Vogelsang P
Solid-State Electronics, 65-66, 38, 2011
6 Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: Part I - Static analysis
Russo S, La Spina L, d'Alessandro V, Rinaldi N, Nanver LK
Solid-State Electronics, 54(8), 745, 2010
7 Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: Part II - Dynamic analysis
Russo S, La Spina L, d'Alessandro V, Rinaldi N, Nanver LK
Solid-State Electronics, 54(8), 754, 2010
8 Ultra-high aspect-ratio FinFET technology
Jovanovic V, Suligoj T, Poljak M, Civale Y, Nanver LK
Solid-State Electronics, 54(9), 870, 2010
9 C-V profiling of ultra-shallow junctions using step-like background profiles
Popadic M, Milovanovic V, Xu CQ, Sarubbi F, Nanver LK
Solid-State Electronics, 54(9), 890, 2010
10 X-ray investigation of buried SiGe islands for devices with strain-enhanced mobility
Hrauda N, Zhang JJ, Stangl J, Rehman-Khan A, Bauer G, Stoffel M, Schmidt OG, Jovanovich V, Nanver LK
Journal of Vacuum Science & Technology B, 27(2), 912, 2009