| 1 |
Effect of Tensile Stress on the Passivity Breakdown and Repassivation of AISI 304 Stainless Steel: A Scanning Kelvin Probe and Scanning Electrochemical Microscopy Study
Nazarov A, Vivier V, Vucko F, Thierry D
Journal of the Electrochemical Society, 166(11), C3207, 2019 |
| 2 |
Effect of Mechanical Stress on the Properties of Steel Surfaces: Scanning Kelvin Probe and Local Electrochemical Impedance Study
Nazarov A, Vivier V, Thierry D, Vucko F, Tribollet B
Journal of the Electrochemical Society, 164(2), C66, 2017 |
| 3 |
Scanning Kelvin Probe for detection of the hydrogen induced by atmospheric corrosion of ultra-high strength steel
Nazarov A, Vucko F, Thierry D
Electrochimica Acta, 216, 130, 2016 |
| 4 |
A review of special gate coupling effects in long-channel SOI MOSFETs with lightly doped ultra-thin bodies and their compact analytical modeling
Rudenko T, Nazarov A, Kilchytska V, Flandre D
Solid-State Electronics, 117, 66, 2016 |
| 5 |
Electrochemical and corrosion properties of ZnO/Zn electrode in atmospheric environments
Nazarov A, Diler E, Persson D, Thierry D
Journal of Electroanalytical Chemistry, 737, 129, 2015 |
| 6 |
Influence of Mechanical Stress on the Potential Distribution on a 301 LN Stainless Steel Surface
Casals NF, Nazarov A, Vucko F, Pettersson R, Thierry D
Journal of the Electrochemical Society, 162(9), C465, 2015 |
| 7 |
On the g(m)/I-D-based approaches for threshold voltage extraction in advanced MOSFETs and their application to ultra-thin body SOI MOSFETs
Rudenko T, Arshad MKM, Raskin JP, Nazarov A, Flandre D, Kilchytska V
Solid-State Electronics, 97, 52, 2014 |
| 8 |
Experimental study of transconductance and mobility behaviors in ultra-thin SOI MOSFETs with standard and thin buried oxides
Rudenko T, Kilchytska V, Burignat S, Raskin JP, Andrieu F, Faynot O, Le Tiec Y, Landry K, Nazarov A, Lysenko VS, Flandre D
Solid-State Electronics, 54(2), 164, 2010 |
| 9 |
Application of EIS and SKP methods for the study of the zinc/polymer interface
Nazarov A, Prosek T, Thierry D
Electrochimica Acta, 53(25), 7531, 2008 |
| 10 |
Application of Volta potential mapping to determine metal surface defects
Nazarov A, Thierry D
Electrochimica Acta, 52(27), 7689, 2007 |
