검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Application of inserts for suppression of coupled dynamic-acoustic effects during confined granular flow in silos Niedostatkiewicz M, Wojcik M, Tejchman J Advanced Powder Technology, 25(1), 398, 2014 |
| 2 |
ECT Image Analysis Methods for Shear Zone Measurements during Silo Discharging Process Grudzien K, Chaniecki Z, Romanowski A, Niedostatkiewicz M, Sankowski D Chinese Journal of Chemical Engineering, 20(2), 337, 2012 |
| 3 |
Analysis of the bulk solid flow during gravitational silo emptying using X-ray and ECT tomography Grudzien K, Niedostatkiewicz M, Adrien J, Maire E, Babout L Powder Technology, 224, 196, 2012 |
| 4 |
Quantitative estimation of volume changes of granular materials during silo flow using X-ray tomography Grudzien K, Niedostatkiewicz M, Adrien J, Tejchman J, Maire E Chemical Engineering and Processing, 50(1), 59, 2011 |
| 5 |
Application of ECT to solid concentration measurements during granular flow in a rectangular model silo Niedostatkiewicz M, Tejchman J, Grudzien K, Chaniecki Z Chemical Engineering Research & Design, 88(8A), 1037, 2010 |
| 6 |
Experimental and theoretical investigations of silo music Wilde K, Tejchman J, Rucka M, Niedostatkiewicz M Powder Technology, 198(1), 38, 2010 |
| 7 |
Determination of bulk solid concentration changes during granular flow in a model silo with ECT sensors Niedostatkiewicz M, Tejchman J, Chaniecki Z, Grudzien K Chemical Engineering Science, 64(1), 20, 2009 |
| 8 |
Investigations of porosity changes during granular silo flow using electrical capacitance tomography (ECT) and particle image velocimetry (PIV) Niedostatkiewicz M, Tejchman J Particle & Particle Systems Characterization, 24(4-5), 304, 2007 |
| 9 |
Application of particle image velocimetry (PIV) for deformation measurement during granular silo flow Slominski C, Niedostatkiewicz M, Tejchman J Powder Technology, 173(1), 1, 2007 |
| 10 |
Application of electrical capacitance tomography for bulk solids flow analysis in silos Chaniecki Z, Dyakowski T, Niedostatkiewicz M, Sankowski D Particle & Particle Systems Characterization, 23(3-4), 306, 2006 |