검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Depth profiling of organic materials using improved ion beam conditions Cramer HG, Grehl T, Kollmer F, Moellers R, Niehuis E, Rading D Applied Surface Science, 255(4), 966, 2008 |
| 2 |
Application of TOF-SIMS for high precision ion implant dosimetry: Possibilities and limitations Grehl T, Mollers R, Niehuis E, Rading D Applied Surface Science, 255(4), 1404, 2008 |
| 3 |
Chemical effects in C-60 irradiation of polymers Mollers R, Tuccitto N, Torrisi V, Niehuis E, Licciardello A Applied Surface Science, 252(19), 6509, 2006 |
| 4 |
Influence of primary ion bombardment conditions on the emission of molecular secondary ions Kersting R, Hagenhoff B, Kollmer F, Mollers R, Niehuis E Applied Surface Science, 231-2, 261, 2004 |
| 5 |
Low energy dual beam depth profiling: influence of sputter and analysis beam parameters on profile performance using TOF-Sims Grehl T, Mollers R, Niehuis E Applied Surface Science, 203, 277, 2003 |
| 6 |
Secondary ion mass spectrometry depth profiling of ultralow-energy ion implants : Problems and solutions van Berkum JGM, Collart EJH, Weemers K, Gravesteijn DJ, Iltgen K, Benninghoven A, Niehuis E Journal of Vacuum Science & Technology B, 16(1), 298, 1998 |
| 7 |
Optimized Time-of-Flight Secondary-Ion Mass-Spectroscopy Depth Profiling with a Dual-Beam Technique Iltgen K, Bendel C, Benninghoven A, Niehuis E Journal of Vacuum Science & Technology A, 15(3), 460, 1997 |
| 8 |
Quantification of Metal Trace Contaminants on Si Wafer Surfaces by Laser-SNMS and ToF-SIMS Using Sputter-Deposited Submonolayer Standards Schnieders A, Mollers R, Terhorst M, Cramer HG, Niehuis E, Benninghoven A Journal of Vacuum Science & Technology B, 14(4), 2712, 1996 |