검색결과 : 7건
No. | Article |
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1 |
Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus Ramirez-Rico J, Lee SY, Ling JJ, Noyan IC Journal of Materials Science, 51(11), 5343, 2016 |
2 |
Prediction of recrystallization times in electroplated copper thin films Treger M, Witt C, Cabral C, Murray C, Jordan-Sweet J, Rosenberg R, Eisenbraun E, Noyan IC Thin Solid Films, 615, 107, 2016 |
3 |
Feasibility of submonolayer ZnTe/ZnCdSe quantum dots as intermediate band solar cell material system Dhomkar S, Manna U, Peng L, Moug R, Noyan IC, Tamargo MC, Kuskovsky IL Solar Energy Materials and Solar Cells, 117, 604, 2013 |
4 |
Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements Murray CE, Polvino SM, Noyan IC, Cai Z, Maser J, Holt M Thin Solid Films, 530, 85, 2013 |
5 |
Mechanics of end effects in thin film and substrate stress distributions Murray CE, Noyan IC Materials Science Forum, 490-491, 13, 2005 |
6 |
Phase transformation of thin sputter-deposited tungsten films at room temperature Rossnagel SM, Noyan IC, Cabral C Journal of Vacuum Science & Technology B, 20(5), 2047, 2002 |
7 |
Characterization of fiber/matrix interfaces using X-ray microtopography Hanan JC, Aydiner CC, Ustundag E, Swift GA, Kaldor SK, Noyan IC Materials Science Forum, 404-7, 919, 2002 |