검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Approaches to calculate the dielectric function of ZnO around the band gap Agocs E, Fodor B, Pollakowski B, Beckhoff B, Nutsch A, Jank M, Petrik P Thin Solid Films, 571, 684, 2014 |
| 2 |
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry Petrik P, Gumprecht T, Nutsch A, Roeder G, Lemberger M, Juhasz G, Polgar O, Major C, Kozma P, Janosov M, Fodor B, Agocs E, Fried M Thin Solid Films, 541, 131, 2013 |
| 3 |
Expanded beam (macro-imaging) ellipsometry Fried M, Juhasz G, Major C, Petrik P, Polgar O, Horvath Z, Nutsch A Thin Solid Films, 519(9), 2730, 2011 |
| 4 |
An X-ray photoelectron spectroscopy study of ultra-thin oxynitride films Ladas S, Sygellou L, Kennou S, Wolf M, Roeder G, Nutsch A, Rambach M, Lerch W Thin Solid Films, 520(2), 871, 2011 |
| 5 |
Sidewall slope control of chemically assisted ion-beam etched structures in InP-based materials Daleiden J, Czotscher K, Hoffmann C, Kiefer R, Klussmann S, Muller S, Nutsch A, Pletschen W, Weisser S, Trankle G, Braunstein J, Weimann G Journal of Vacuum Science & Technology B, 16(4), 1864, 1998 |