검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Lithography-free fabrication of sub-100 nm structures by self-aligned plasma etching of silicon dioxide layers and silicon Georgiev G, Muller-Wiegand M, Georgieva A, Ludolph K, Oesterschulze E Journal of Vacuum Science & Technology B, 21(4), 1361, 2003 |
| 2 |
Fabrication of subwavelength surface structures combining self-assembled masking layer with plasma etching techniques Oesterschulze E, Georgiev G, Muller-Wiegand M, Georgieva A, Ludolph K Journal of Vacuum Science & Technology B, 21(6), 2496, 2003 |
| 3 |
Technology to reduce the aperture size of microfabricated silicon dioxide aperture tips Vollkopf A, Georgiev G, Rudow O, Muller-Wiegand M, Oesterschulze E Journal of the Electrochemical Society, 148(10), G587, 2001 |
| 4 |
Cantilever probes for spatio-temporal imaging of voltage pulses with an ultrafast scanning probe microscope Oesterschulze E, Heisig S, Steffens WM Journal of Vacuum Science & Technology B, 19(1), 107, 2001 |
| 5 |
Reproducible large-area microfabrication of sub-100 nm apertures on hollow tips Mihalcea C, Vollkopf A, Oesterschulze E Journal of the Electrochemical Society, 147(5), 1970, 2000 |
| 6 |
Evaluating probes for "electrical" atomic force microscopy Trenkler T, Hantschel T, Stephenson R, De Wolf P, Vandervorst W, Hellemans L, Malave A, Buchel D, Oesterschulze E, Kulisch W, Niedermann P, Sulzbach T, Ohlsson O Journal of Vacuum Science & Technology B, 18(1), 418, 2000 |
| 7 |
Optical active gallium arsenide cantilever probes for combined scanning near-field optical microscopy and scanning force microscopy Heisig S, Rudow O, Oesterschulze E Journal of Vacuum Science & Technology B, 18(3), 1134, 2000 |
| 8 |
Photothermal Imaging by Scanning Thermal Microscopy Oesterschulze E, Stopka M Journal of Vacuum Science & Technology A, 14(3), 1172, 1996 |
| 9 |
Thermal Imaging of Thin-Films by Scanning Thermal Microscope Oesterschulze E, Stopka M, Ackermann L, Scholz W, Werner S Journal of Vacuum Science & Technology B, 14(2), 832, 1996 |
| 10 |
Atomic-Force Microscopy and Lateral Force Microscopy Using Piezoresistive Cantilevers Linnemann R, Gotszalk T, Rangelow IW, Dumania P, Oesterschulze E Journal of Vacuum Science & Technology B, 14(2), 856, 1996 |