화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Contact Resistance of Screen Printed Ag-Contacts to Si Emitters: Mathematical Modeling and Microstructural Characterization
Svensson AM, Olibet S, Rudolph D, Cabrera E, Friis J, Butler K, Harding J
Journal of the Electrochemical Society, 161(8), E3180, 2014
2 Improved QSS-mu PCD measurement with quality of decay control: Correlation with steady-state carrier lifetime
Wilson M, Edelman P, Lagowski J, Olibet S, Mihailetchi V
Solar Energy Materials and Solar Cells, 106, 66, 2012
3 Ultra-high quality surface passivation of crystalline silicon wafers in large area parallel plate reactor at 40 MHz
Damon-Lacoste J, Fesquet L, Olibet S, Ballif C
Thin Solid Films, 517(23), 6401, 2009