화학공학소재연구정보센터
검색결과 : 19건
No. Article
1 Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET
Sato S, Ghibaudo G, Benea L, Ionica I, Omura Y, Cristoloveanu S
Solid-State Electronics, 159, 197, 2019
2 Effects of Applied Voltage and Solution pH in Fabricating Multilayers of Weakly Charged Polyelectrolytes and Nanoparticles
Omura Y, Kyung KH, Shiratori S, Kim SH
Industrial & Engineering Chemistry Research, 53(29), 11727, 2014
3 Proposal of preliminary device model and scaling scheme of cross-current tetrode SOI MOSFET aiming at low-energy circuit applications
Omura Y, Azuma Y, Yoshioka Y, Fukuchi K, Ino D
Solid-State Electronics, 64(1), 18, 2011
4 Impact of metal silicide layout covering source/drain diffusion region on minimization of parasitic resistance of triple-gate SOI MOSFET and proposal of practical design guideline
Omura Y, Yoshimoto K, Hayashi O, Wakabayashi H, Yamakawa S
Solid-State Electronics, 53(9), 959, 2009
5 Impact of H2O2 inclusion in HF solution on bulk and silicon-on-insulator wafer surfaces
Imou N, Ishiyama T, Omura Y
Journal of the Electrochemical Society, 153(1), G59, 2006
6 Preparation and biocompatibility of novel UV-curable chitosan derivatives
Renbutsu E, Hirose M, Omura Y, Nakatsubo F, Okamura Y, Okamoto Y, Saimoto H, Shigemasa Y, Minami S
Biomacromolecules, 6(5), 2385, 2005
7 Physics-based model of quantum-mechanical wave function penetration into thin dielectric films for evaluating modern MOS capacitors
Nakamori Y, Moriguchi K, Komiya K, Omura Y
Solid-State Electronics, 49(7), 1118, 2005
8 Recycling of waste lubricant oil into chemical feedstock or fuel oil over supported iron oxide catalysts
Bhaskar T, Uddin MA, Muto A, Sakata Y, Omura Y, Kimura K, Kawakami Y
Fuel, 83(1), 9, 2004
9 Quantum mechanical effect in temperature dependence of threshold voltage of extremely thin SOI MOSFETs
Omura Y, Nakakubo A, Nakatsuji H
Solid-State Electronics, 48(9), 1661, 2004
10 Device models of SOI insulated-gate p-n junction devices
Wakita S, Omura Y
Journal of the Electrochemical Society, 150(12), G816, 2003