1 |
Impact of contact and channel resistance on the frequency-dependent capacitance and conductance of pseudo-MOSFET Sato S, Ghibaudo G, Benea L, Ionica I, Omura Y, Cristoloveanu S Solid-State Electronics, 159, 197, 2019 |
2 |
Effects of Applied Voltage and Solution pH in Fabricating Multilayers of Weakly Charged Polyelectrolytes and Nanoparticles Omura Y, Kyung KH, Shiratori S, Kim SH Industrial & Engineering Chemistry Research, 53(29), 11727, 2014 |
3 |
Proposal of preliminary device model and scaling scheme of cross-current tetrode SOI MOSFET aiming at low-energy circuit applications Omura Y, Azuma Y, Yoshioka Y, Fukuchi K, Ino D Solid-State Electronics, 64(1), 18, 2011 |
4 |
Impact of metal silicide layout covering source/drain diffusion region on minimization of parasitic resistance of triple-gate SOI MOSFET and proposal of practical design guideline Omura Y, Yoshimoto K, Hayashi O, Wakabayashi H, Yamakawa S Solid-State Electronics, 53(9), 959, 2009 |
5 |
Impact of H2O2 inclusion in HF solution on bulk and silicon-on-insulator wafer surfaces Imou N, Ishiyama T, Omura Y Journal of the Electrochemical Society, 153(1), G59, 2006 |
6 |
Preparation and biocompatibility of novel UV-curable chitosan derivatives Renbutsu E, Hirose M, Omura Y, Nakatsubo F, Okamura Y, Okamoto Y, Saimoto H, Shigemasa Y, Minami S Biomacromolecules, 6(5), 2385, 2005 |
7 |
Physics-based model of quantum-mechanical wave function penetration into thin dielectric films for evaluating modern MOS capacitors Nakamori Y, Moriguchi K, Komiya K, Omura Y Solid-State Electronics, 49(7), 1118, 2005 |
8 |
Recycling of waste lubricant oil into chemical feedstock or fuel oil over supported iron oxide catalysts Bhaskar T, Uddin MA, Muto A, Sakata Y, Omura Y, Kimura K, Kawakami Y Fuel, 83(1), 9, 2004 |
9 |
Quantum mechanical effect in temperature dependence of threshold voltage of extremely thin SOI MOSFETs Omura Y, Nakakubo A, Nakatsuji H Solid-State Electronics, 48(9), 1661, 2004 |
10 |
Device models of SOI insulated-gate p-n junction devices Wakita S, Omura Y Journal of the Electrochemical Society, 150(12), G816, 2003 |