검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Procedure to convert optical-constant models into analytic Larruquert JI, Rodriguez-de Marcos LV Thin Solid Films, 664, 52, 2018 |
| 2 |
Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy Edon V, Hugon MC, Agius B, Durand O, Eypert C, Cardinaud C Thin Solid Films, 516(22), 7974, 2008 |
| 3 |
An ellipsometric study of W thin films deposited on Si Deineka AG, Tarasenko AA, Jastrabik L, Chvostova D, Bousek J Thin Solid Films, 339(1-2), 216, 1999 |