검색결과 : 21건
| No. | Article |
|---|---|
| 1 |
Focused chromium ion beam Steele AV, Knuffman B, McClelland JJ, Orloff J Journal of Vacuum Science & Technology B, 28(6), C6F1, 2010 |
| 2 |
Analytical model of a gas phase field ionization source Liu XF, Orloff J Journal of Vacuum Science & Technology B, 23(6), 2816, 2005 |
| 3 |
High-resolution primary ion beam probe for SIMS Guharay SK, Douglass S, Orloff J Applied Surface Science, 231-2, 926, 2004 |
| 4 |
Focused ion beam created periodic structures on tapered optical fibers Hodzic V, Orloff J, Davis C Journal of Vacuum Science & Technology B, 21(6), 2711, 2003 |
| 5 |
Testing new chemistries for mask repair with focused ion beam gas assisted etching Stanishevsky A, Edinger K, Orloff J, Melngailis J, Stewart D, Williams A, Clark R Journal of Vacuum Science & Technology B, 21(6), 3067, 2003 |
| 6 |
Characteristics of ion beams from a Penning source for focused ion beam applications Guharay SK, Sokolovsky E, Orloff J Journal of Vacuum Science & Technology B, 17(6), 2779, 1999 |
| 7 |
Microelectronics and nanometer structures - Processing, measurement, and phenomena - Preface Melngailis J, Gamo K, Orloff J Journal of Vacuum Science & Technology B, 16(4), 2438, 1998 |
| 8 |
Combined method of focused ion beam milling and ion implantation techniques for the fabrication of high temperature superconductor Josephson junctions Chen CH, Jin I, Pai SP, Dong ZW, Sharma RP, Lobb CJ, Venkatesan T, Edinger K, Orloff J, Melngailis J, Zhang Z, Chu WK Journal of Vacuum Science & Technology B, 16(5), 2898, 1998 |
| 9 |
Study of precursor gases for focused ion beam insulator deposition Edinger K, Melngailis J, Orloff J Journal of Vacuum Science & Technology B, 16(6), 3311, 1998 |
| 10 |
Characteristics of focused beam spots using negative ion beams from a compact surface plasma source and merits for new applications Guharay SK, Sokolovsky E, Orloff J Journal of Vacuum Science & Technology B, 16(6), 3370, 1998 |