검색결과 : 2건
No. | Article |
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1 |
Physical properties of an oxide photoresist film for submicron pattern lithography Chiang D, Chang CM, Chen SW, Yang CT, Hsueh WJ Thin Solid Films, 542, 409, 2013 |
2 |
Analysis of amine contamination on silicon oxide surfaces using ToF-SIMS Lu D, Mo ZQ, Xing ZX, Gui D Applied Surface Science, 233(1-4), 352, 2004 |