화학공학소재연구정보센터
검색결과 : 49건
No. Article
1 Structure determination of substrate influenced silicon nano-ribbon growth
Roese P, Shamout K, Espeter P, Honig R, Berges U, Westphal C
Applied Surface Science, 467, 580, 2019
2 GaN quantum dot polarity determination by X-ray photoelectron diffraction
Romanyuk O, Bartos I, Brault J, De Mierry P, Paskova T, Jiricek P
Applied Surface Science, 389, 1156, 2016
3 Polarity of wurtzite crystals by photoelectron diffraction
Bartos I, Romanyuk O
Applied Surface Science, 315, 506, 2014
4 Interfacial properties of all-epitaxial Fe-Ge/Ge heterostructures on Ge(111)
Maafa I, Jaafar R, Hajjar-Garreau S, Berling D, Mehdaoui A, Pirri C, Deny E, Florentin A, Uhlaq-Bouillet C, Garreau G
Thin Solid Films, 545, 257, 2013
5 Circular dichroism of forward focusing peaks and diffraction rings in 2 pi steradian Si 2p photoelectron pattern
Inaji K, Matsui F, Kato Y, Sakai C, Narikawa T, Matsushita T, Guo FZ, Daimon H
Applied Surface Science, 254(23), 7549, 2008
6 Crystallographic structure of ultra-thin films of Pd on Ni(111) and Ni on Pd(111) studied by photoelectron diffraction
Nascente PAP, Carazzolle MF, de Siervo A, Maluf SS, Landers R, Kleiman GG
Journal of Molecular Catalysis A-Chemical, 281(1-2), 3, 2008
7 Structural investigation of the LaAlO(3)(110) surface
Mortada H, Derivaz M, Dentel D, Bischoff JL
Thin Solid Films, 517(1), 441, 2008
8 Layer-by-layer deposition of zirconium oxide films from aqueous solutions for friction reduction in silicon-based micro electromechanical system devices
Liu JF, Nistorica C, Gory I, Skidmore G, Mantiziba FM, Gnade BE
Thin Solid Films, 492(1-2), 6, 2005
9 Surface phase transitions at metal-semiconductor interfaces: a revisit is needed
Davila ME, Avila J, Ascolani H, Le Lay G, Gothelid M, Karlsson UO, Asensio MC
Applied Surface Science, 234(1-4), 274, 2004
10 Adsorption of thiophene on a Si(001)-2 x 1 surface studied by photoelectron spectroscopy and diffraction
Shimomura A, Ikejima Y, Yajima K, Yagi T, Goto T, Gunnella R, Abukawa T, Fukuda Y, Kono S
Applied Surface Science, 237(1-4), 75, 2004