검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Optical characterization of thin chalcogenide films by multiple-angle-of-incidence ellipsometry Todorov R, Paneva A, Petkov K Thin Solid Films, 518(12), 3280, 2010 |
| 2 |
Effect of r.f. hydrogen plasma annealing on the properties Of Si/SiO2 interface: a spectroscopic ellipsometry study Paneva A, Szekeres A Thin Solid Films, 433(1-2), 367, 2003 |
| 3 |
Spectroscopic ellipsometry characterization of strained interface region in thermally oxidized Si(111) Szekeres A, Paneva A, Alexandrova S Thin Solid Films, 343-344, 385, 1999 |