화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Buckle depression as a signature of Young's modulus mismatch between a film and its substrate
Boijoux R, Parry G, Coupeau C
Thin Solid Films, 645, 379, 2018
2 Investigation of the fracture of very thin amorphous alumina film during spherical nanoindentation
Mercier D, Mandrillon V, Parry G, Verdier M, Estevez R, Brechet Y, Maindron T
Thin Solid Films, 638, 34, 2017
3 Strain inhomogeneity in copper islands probed by coherent X-ray diffraction
Beutier G, Verdier M, Parry G, Gilles B, Labat S, Richard MI, Cornelius T, Lory PF, Hoang SV, Livet F, Thomas O, de Boissieu M
Thin Solid Films, 530, 120, 2013
4 Modified 4-Point Bending Test for Adhesion Measurement at the Interface of Iron Coated with Aluminum Casting Alloy
Zhe M, Dezellus O, Parry G, Braccini M, Viala JC
Journal of Adhesion Science and Technology, 26(1-3), 1, 2011
5 Spectroscopic evaluation of the structural and compositional properties of GaNxAs1-x superlattices grown by molecular beam epitaxy
Barker SJ, Williams RS, Mulcahy CPA, Steer MJ, Hopkinson M, Ashwin MJ, Newman RC, Stavrinou PN, Parry G, Jones TS
Thin Solid Films, 515(10), 4430, 2007
6 RF-plasma source qualification and compositional characterisation of GaNAs superlattices using SIMS
Mulcahy CPA, Barker SJ, Williams RS, Hopkinson M, Ashwin M, Stavrinou PN, Parry G, Biswass S, Jones TS
Applied Surface Science, 252(19), 7218, 2006
7 Connexin-26 Mutations in Hereditary Non-Syndromic Sensorineural Deafness
Kelsell DP, Dunlop J, Stevens HP, Lench NJ, Liang JN, Parry G, Mueller RF, Leigh IM
Nature, 387(6628), 80, 1997
8 Growth and Characterization of Si1-xGex Si Multilayers on Patterned Si(001) Substrates Using Gas-Source Molecular-Beam Epitaxy
Zhang J, Marinopoulou A, Hartung J, Lightowlers EC, Anwar N, Parry G, Xie MH, Mokler SM, Wu XD, Joyce BA
Journal of Vacuum Science & Technology A, 12(4), 1139, 1994