화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Formation of Si:CP layer through in-situ doping and implantation process for n-type metal-oxide-semiconductor devices
Mochizuki S, Loesing R, Zhu ZM, Domenicucci AG, Flaitz PL, Li JH, Paruchuri V
Thin Solid Films, 557, 94, 2014
2 Ultra-low resistivity in-situ phosphorus doped Si and SiC epitaxy for source/drain formation in advanced 20 nm n-type field effect transistor devices
Loubet N, Adam T, Raymond M, Liu Q, Cheng KG, Sreenivasan R, Reznicek A, Khare P, Kleemeier W, Paruchuri V, Doris B, Sampson R
Thin Solid Films, 520(8), 3149, 2012
3 Effect of Thermal Annealing on Carbon in In-situ Phosphorous-Doped Si1-xCx films
Adam T, Loubet N, Reznicek A, Paruchuri V, Sampson R, Sadana D
Thin Solid Films, 520(8), 3155, 2012