화학공학소재연구정보센터
검색결과 : 12건
No. Article
1 Self-organization of palladium nanoislands on GaN and AlxGa1-xN/GaN heterostructures
Stafiniak A, Szymanski T, Paszkiewicz R
Applied Surface Science, 426, 123, 2017
2 Optimization of AlGaN/GaN/Si(111) buffer growth conditions for nitride based HEMTs on silicon substrates
Wosko M, Paszkiewicz B, Szymanski T, Paszkiewicz R
Journal of Crystal Growth, 414, 248, 2015
3 GaN ceramics obtained by fusing of nanocrystalline GaN powder at high pressures and temperatures as substrate for growth of GaN epilayers
Podhorodecki A, Nyk M, Kudrawiec R, Misiewicz J, Paszkiewicz R, Korbutowicz R, Serafinczuk J, Strek W
Journal of Crystal Growth, 310(5), 940, 2008
4 Properties of MOVPE GaN grown on ZnO deposited on Si(001) and Si(111) substrates
Paszkiewicz R, Paszkiewicz B, Wosko M, Szyszka A, Marciniak L, Prazmowska J, Macherzynski W, Serafinczuk J, Kozlowski J, Tlaczala M, Kovac J, Novotny I, Skriniarova J, Hasko D
Journal of Crystal Growth, 310(23), 4891, 2008
5 Structure and optical properties of MOVPE and HVPE GaN films grown on GaN nanocrystalline powder substrate
Nyk M, Kudrawiec R, Misiewicz J, Paszkiewicz R, Korbutowicz R, Kozlowski J, Serafinczuk J, Strek W
Journal of Crystal Growth, 277(1-4), 149, 2005
6 Studies of GaAs metal-insulator-semiconductor structures by the admittance spectroscopy method
Kochowski S, Nitsch K, Paszkiewicz B, Paszkiewicz R, Szydlowski M
Applied Surface Science, 235(3), 389, 2004
7 Synthesis and properties of UV-curable poly(imideurethane) acrylates
Meledyn M, Paszkiewicz R, Masiulanis B
Journal of Applied Polymer Science, 91(2), 971, 2004
8 Characterization of the interface and the bulk phenomena in metal-SiO2-(n) GaAs structure by analysis of the equivalent circuit parameters at different temperatures
Kochowski S, Nitsch K, Paszkiewicz B, Paszkiewicz R
Thin Solid Films, 467(1-2), 190, 2004
9 Influence of crystallographic structure on electrical characteristics of (Al, Ga)N epitaxial layers grown by MOVPE method
Paszkiewicz R, Paszkiewicz B, Kozlowski J, Piasecki M, Kosnikowski W, Tlaczala M
Journal of Crystal Growth, 248, 487, 2003
10 Two constant phase element behaviour of the admittance characteristics of GaAs metal-insulator-semiconductor structure with deep traps
Kochowski S, Nitsch K, Paszkiewicz B, Paszkiewicz R
Thin Solid Films, 444(1-2), 208, 2003