검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Investigation of epitaxial process-induced stacking faults on silicon wafers by surface analytical methods Patsch B, Ehlert A, Lankmayr E Journal of the Electrochemical Society, 155(7), H540, 2008 |
| No. | Article |
|---|---|
| 1 |
Investigation of epitaxial process-induced stacking faults on silicon wafers by surface analytical methods Patsch B, Ehlert A, Lankmayr E Journal of the Electrochemical Society, 155(7), H540, 2008 |