검색결과 : 8건
| No. | Article |
|---|---|
| 1 |
Cubic inclusions in 4H-SIC studied with ballistic electron-emission microscopy Ding Y, Park KB, Pelz JP, Palle KC, Mikhov MK, Skromme BJ Journal of Vacuum Science & Technology A, 22(4), 1351, 2004 |
| 2 |
Ballistic electron emission microscopy study of p-type 4H-SiC Ding Y, Park KB, Pelz JP, Los AV, Mazzola MS Materials Science Forum, 457-460, 1077, 2004 |
| 3 |
Ultrahigh vacuum dual fluid line rotatable connector Kaczer B, Jones DE, Im HJ, Pelz JP Journal of Vacuum Science & Technology A, 17(2), 674, 1999 |
| 4 |
Effect of tensile strain on B-type step energy on Si(001)-(2x1) surfaces determined by switch-kink counting Heller ER, Jones DE, Pelz JP, Xie YH, Silverman PJ Journal of Vacuum Science & Technology A, 17(4), 1663, 1999 |
| 5 |
Scanning tunneling microscope studies of boron-doped Si(001) Nielsen JF, Im HJ, Pelz JP, Krueger M, Borovsky B, Ganz E Journal of Vacuum Science & Technology A, 17(4), 1670, 1999 |
| 6 |
Investigation of ultrathin SiO2 film thickness variations by ballistic electron emission microscopy Kaczer B, Im HJ, Pelz JP Journal of Vacuum Science & Technology B, 16(4), 2302, 1998 |
| 7 |
Ballistic-Electron-Emission Microscopy Studies of Charge Trapping in SiO2 Kaczer B, Pelz JP Journal of Vacuum Science & Technology B, 14(4), 2864, 1996 |
| 8 |
Evolution of Atomic-Scale Roughening on Si(001)-(2X1) Surfaces Resulting from High-Temperature Oxidation Seiple JV, Pelz JP Journal of Vacuum Science & Technology A, 13(3), 772, 1995 |