검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Surface diagnostics of dry etched III-V semiconductor samples using focused ton beam and secondary ion mass spectrometry Yu SY, Heard P, Cakmak B, Penty RV, White IH Journal of Vacuum Science & Technology B, 17(6), 3080, 1999 |
| 2 |
Mechanisms of Luminescence Tuning and Quenching in Porous Silicon Peter LM, Riley DJ, Wielgosz RI, Snow PA, Penty RV, White IH, Meulenkamp EA Thin Solid Films, 276(1-2), 123, 1996 |