검색결과 : 8건
No. | Article |
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1 |
Effect of HCl catalyst in the formation of flat structures of Ta2O5 thin films by sol-gel technique Cantalini C, Pelino M, Phani RA, Passacantando M, Picozzi P, Santucci S Journal of Vacuum Science & Technology A, 18(4), 1561, 2000 |
2 |
X-ray reflectivity study on TiN/Ti/Si structures before and after annealing Santucci S, Giuliani P, Picozzi P, Phani AR, De Biase M, Alfonsetti R, Moccia G, Missori M Thin Solid Films, 360(1-2), 89, 2000 |
3 |
Preparation and characterization of bulk ZnGa2O4 Phani AR, Santucci S, Di Nardo S, Lozzi L, Passacantando M, Picozzi P, Cantalini C Journal of Materials Science, 33(15), 3969, 1998 |
4 |
Studies on structural, electrical, compositional, and mechanical properties of WSix thin films produced by low-pressure chemical vapor deposition Santucci S, Lozzi L, Passacantando M, Picozzi P, Petricola P, Moccia G, Alfonsetti R, Diamanti R Journal of Vacuum Science & Technology A, 16(3), 1207, 1998 |
5 |
Compositional Characterization of Very Thin SiO2/Si3N4/SiO2 Stacked Films by X-Ray Photoemission Spectroscopy and Time-of-Flight Secondary-Ion Mass-Spectroscopy Techniques Santucci S, Lozzi L, Ottaviano L, Passacantando M, Picozzi P, Moccia G, Alfonsetti R, Digiacomo A, Fiorani P Journal of Vacuum Science & Technology A, 15(3), 905, 1997 |
6 |
Rectifying Behavior of Silicon-Phthalocyanine Junctions Investigated with Scanning-Tunneling-Microscopy Spectroscopy Ottaviano L, Santucci S, Dinardo S, Lozzi L, Passacantando M, Picozzi P Journal of Vacuum Science & Technology A, 15(3), 1014, 1997 |
7 |
Study by X-Ray Photoelectron-Spectroscopy and X-Ray-Diffraction of the Growth of Tin Thin-Films Obtained by Nitridation of Ti Layers Santucci S, Lozzi L, Passacantando M, Picozzi P, Alfonsetti R, Diamanti R, Moccia G Thin Solid Films, 290-291, 376, 1996 |
8 |
Production and Characterization of Multilayer KCl-LiF Thin-Films on Glass Somma F, Ercoli A, Santucci S, Lozzi L, Passacantando M, Picozzi P Journal of Vacuum Science & Technology A, 13(3), 1013, 1995 |