화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 X-ray diffraction investigations of structural changes in Co/Cu multilayers at elevated temperatures
Hecker M, Pitschke W, Tietjen D, Schneider CM
Thin Solid Films, 411(2), 234, 2002
2 Formation of nanocrystalline Re-Si thin film composites
Pitschke W, Hofman D, Burkov AT, Schumann J, Heinrich A
Materials Science Forum, 378-3, 352, 2001
3 Stress development in FeAl8 thin films during heat treatment
Zeiger W, Bruckner W, Schumann J, Pitschke W, Worch H
Thin Solid Films, 370(1-2), 315, 2000
4 In2O3 : Differences in the chemical and physical behaviour of single crystals, ceramics and fine powders
Behr G, Werner J, Oswald S, Krabbes G, Dordor P, Elefant D, Pitschke W
Solid State Ionics, 101-103, 1183, 1997
5 Phase formation process of IrxSi1-x thin films structure and electrical properties
Kurt R, Pitschke W, Heinrich A, Schumann J, Thomas J, Wetzig K, Burkov A
Thin Solid Films, 310(1-2), 8, 1997
6 Resistance Behavior and Interdiffusion of Layered Cuni-Nicr Films
Bruckner W, Schumann J, Baunack S, Pitschke W, Knuth T
Thin Solid Films, 258(1-2), 236, 1995
7 X-Ray-Diffraction Studies of the Structure of Molybdenum Sulfide Thin-Films
Doyle SE, Mattern N, Pitschke W, Weise G, Kraut D, Bauer HD
Thin Solid Films, 245(1-2), 255, 1994
8 Nanodispersed Crxsi1-X Thin-Films - Transport-Properties and Thermoelectric Application
Schumann J, Gladun C, Monch JI, Heinrich A, Thomas J, Pitschke W
Thin Solid Films, 246(1-2), 24, 1994