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| No. | Article |
|---|---|
| 1 |
Nanoscale characterization of squaraine-fullerene-based photovoltaic active layers by atomic force microscopy mechanical and electrical property mapping Coffey T, Seredinski A, Poler JN, Patteson C, Watts WH, Baptiste K, Zheng CY, Cody J, Collison CJ Thin Solid Films, 669, 120, 2019 |