검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Palladium contamination in silicon Polignano ML, Mica I, Ceresoli M, Codegoni D, Somaini F, Bianchi I, Volonghi D Solid-State Electronics, 106, 68, 2015 |
| 2 |
Proximity gettering of slow diffuser contaminants in CMOS image sensors Russo F, Moccia G, Nardone G, Alfonsetti R, Polsinelli G, D'Angelo A, Patacchiola A, Liverani M, Pianezza P, Lippa T, Carlini M, Polignano ML, Mica I, Cazzini E, Ceresoli M, Codegoni D Solid-State Electronics, 91, 91, 2014 |
| 3 |
Simultaneous characterization of bulk impurities and interface states by photocurrent measurements Polignano ML, Caricato AP Applied Surface Science, 235(3), 340, 2004 |
| 4 |
Quantitative evaluation of iron at the silicon surface after wet cleaning treatments Caputo D, Bacciaglia P, Carpanese C, Polignano ML, Lazzeri P, Bersani M, Vanzetti L, Pianetta P, Moro L Journal of the Electrochemical Society, 151(5), G289, 2004 |
| 5 |
Detection of metal segregation at the oxide-silicon interface Polignano ML, Giussani A, Caputo D, Clementi C, Pavia G, Priolo F Journal of the Electrochemical Society, 149(7), G429, 2002 |
| 6 |
Surface characterization by photocurrent measurements Polignano ML, Caricato AP, Modelli A, Zonca R Applied Surface Science, 154, 276, 2000 |
| 7 |
A novel method for the simultaneous characterization of bulk impurities and surface states by photocurrent measurements Polignano ML, Caricato AP, Modelli A, Zonca R Journal of the Electrochemical Society, 147(4), 1577, 2000 |
| 8 |
Surface recombination velocity from photocurrent measurements -Validation and applications Polignano ML, Bellafiore N, Caputo D, Caricato AP, Modelli A, Zonca R Journal of the Electrochemical Society, 146(12), 4640, 1999 |
| 9 |
Denuded zone thickness from surface photovoltage measurements -Comparison with microscopy techniques Polignano ML, Brambilla M, Cazzaniga F, Pavia G, Zanderigo F Journal of the Electrochemical Society, 145(5), 1632, 1998 |