검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Bipolar Switching Characteristics and Scalability in NiO Layers Made by Thermal Oxidation of Ni Goux L, Polspoel W, Lisoni JG, Chen YY, Pantisano L, Wang XP, Vandervorst W, Jurczak M, Wouters DJ Journal of the Electrochemical Society, 157(8), G187, 2010 |
| 2 |
Experimental studies of dose retention and activation in fin field-effect-transistor-based structures Mody J, Duffy R, Eyben P, Goossens J, Moussa A, Polspoel W, Berghmans B, van Dal MJH, Pawlak BJ, Kaiser M, Weemaes RGR, Vandervorst W Journal of Vacuum Science & Technology B, 28(1), C1H5, 2010 |
| 3 |
Experimental studies of dose retention and activation in fin field-effect-transistor-based structures (vol 28, pg C1H5, 2010) Mody J, Duffy R, Eyben P, Goossens J, Moussa A, Polspoel W, Berghmans B, van Dal MJH, Pawlak BJ, Kaiser M, Weemaes RGR, Vandervorst W Journal of Vacuum Science & Technology B, 28(3), 648, 2010 |
| 4 |
Comparison of standard macroscopic and conductive atomic force microscopy leakage measurements on gate removed high-k capacitors Polspoel W, Vandervorst W, Aguilera L, Porti M, Nafria M, Aymerich X Journal of Vacuum Science & Technology B, 27(1), 356, 2009 |
| 5 |
Influence of vacuum environment on conductive atomic force microscopy measurements of advanced metal-oxide-semiconductor gate dielectrics Aguilera L, Polspoel W, Volodin A, Van Haesendonck C, Porti M, Vandervorst W, Nafria M, Aymerich X Journal of Vacuum Science & Technology B, 26(4), 1445, 2008 |