검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Multi-level numerical and statistical analysis of the hygrothermal behavior of a non-vegetated green roof in a mediterranean climate Brunetti G, Porti M, Piro P Applied Energy, 221, 204, 2018 |
| 2 |
Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization Lanza M, Bayerl A, Gao T, Porti M, Nafria M, Jing GY, Zhang YF, Liu ZF, Duan HL Advanced Materials, 25(10), 1440, 2013 |
| 3 |
Dielectric Breakdown In Ultra-Thin Hf Based Gate Stacks: A Resistive Switching Phenomenon Rodriguez R, Martin-Martinez J, Crespo-Yepes A, Porti M, Nafria M, Aymerich X Journal of the Electrochemical Society, 159(5), H529, 2012 |
| 4 |
Grain boundary-driven leakage path formation in HfO2 dielectrics Bersuker G, Yum J, Vandelli L, Padovani A, Larcher L, Iglesias V, Porti M, Nafria M, McKenna K, Shluger A, Kirsch P, Jammy R Solid-State Electronics, 65-66, 146, 2011 |
| 5 |
Comparison of standard macroscopic and conductive atomic force microscopy leakage measurements on gate removed high-k capacitors Polspoel W, Vandervorst W, Aguilera L, Porti M, Nafria M, Aymerich X Journal of Vacuum Science & Technology B, 27(1), 356, 2009 |
| 6 |
Development of a conductive atomic force microscope with a logarithmic current-to-voltage converter for the study of metal oxide semiconductor gate dielectrics reliability Aguilera L, Lanza M, Bayerl A, Porti M, Nafria M, Aymerich X Journal of Vacuum Science & Technology B, 27(1), 360, 2009 |
| 7 |
Implanted and irradiated SiO2/Si structure electrical properties at the nanoscale Porti M, Nafria N, Gerardin S, Aymerich X, Cester A, Paccagnella A, Ghidini G Journal of Vacuum Science & Technology B, 27(1), 421, 2009 |
| 8 |
Peculiar characteristics of nanocrystal memory cells programming window Gasperin A, Amat E, Martin J, Porti M, Nafria M, Paccagnella A Journal of Vacuum Science & Technology B, 27(1), 512, 2009 |
| 9 |
Influence of vacuum environment on conductive atomic force microscopy measurements of advanced metal-oxide-semiconductor gate dielectrics Aguilera L, Polspoel W, Volodin A, Van Haesendonck C, Porti M, Vandervorst W, Nafria M, Aymerich X Journal of Vacuum Science & Technology B, 26(4), 1445, 2008 |