검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Optical metrology of thick photoresist process for advanced 3D applications Nolot E, Andre A, Scibetta C, Poulingue M, Levin L, Vignoud L, Issele H Thin Solid Films, 571, 609, 2014 |
| 2 |
Electro-optic characterization of epitaxial Ba0.7Sr0.3TiO3 thin films using prism coupling technique Wang DY, Li S, Chan HLW, Choy CL Current Applied Physics, 11(3), S52, 2011 |
| 3 |
Characterization of thick GaN layers using guided optical waves Ciplys D, Rimeika R, Khan MA, Yang JW, Gaska R, Shur MS Materials Science Forum, 338-3, 1583, 2000 |