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| No. | Article |
|---|---|
| 1 |
Origin, symmetry, and temperature dependence of the perturbation induced by Si extrinsic defects on the Sn/Si(111) alpha surface: A scanning tunneling microscopy study Ottaviano L, Crivellari M, Profeta G, Continenza A, Lozzi L, Santucci S Journal of Vacuum Science & Technology A, 18(4), 1946, 2000 |