| 1 |
The effect of yttrium addition on oxidation of a sputtered nanocrystalline coating with moderate amount of tantalum in composition
Wang JL, Chen MH, Yang LL, Liu L, Zhu SL, Wang FH, Meng GZ
Applied Surface Science, 366, 245, 2016 |
| 2 |
Ta effect on oxidation of a nickel-based single-crystal superalloy and its sputtered nanocrystalline coating at 900-1100 degrees C
Wang JL, Chen MH, Zhu SL, Wang FH
Applied Surface Science, 345, 194, 2015 |
| 3 |
CeO2-doped (Co,Mn)(3)O-4 coatings for protecting solid oxide fuel cell interconnect alloys
Zhu JH, Lewis MJ, Du SW, Li YT
Thin Solid Films, 596, 179, 2015 |
| 4 |
Metallic interconnects for solid oxide fuel cell: Effect of water vapour on oxidation resistance of differently coated alloys
Fontana S, Chevalier S, Caboche G
Journal of Power Sources, 193(1), 136, 2009 |
| 5 |
Effect of reactive elements on oxidation behaviour of Fe-22Cr-0.5Mn ferritic stainless steel for a solid oxide fuel cell interconnect
Seo HS, Jin GX, Jun JH, Kim DH, Kim KY
Journal of Power Sources, 178(1), 1, 2008 |
| 6 |
Chromia scale adhesion on 430 stainless steel: Effect of different surface treatments
Belogolovsky I, Hou PY, Jacobson CP, Visco SJ
Journal of Power Sources, 182(1), 259, 2008 |
| 7 |
The effect of minor elements on the growth and electrical properties of NiO on Ni
Jackson RW, Leonard JP, Pettit FS, Meier GH
Solid State Ionics, 179(37), 2111, 2008 |
| 8 |
Metallic interconnects for SOFC: Characterisation of corrosion resistance and conductivity evaluation at operating temperature of differently coated alloys
Fontana S, Amendola R, Chevalier S, Piccardo P, Caboche G, Viviani M, Molins R, Sennour M
Journal of Power Sources, 171(2), 652, 2007 |
| 9 |
Oxidation behavior of Pt plus Hf-modified gamma-Ni plus gamma'-Ni(3)Al alloys
Izumi T, Gleeson B
Materials Science Forum, 522-523, 221, 2006 |
| 10 |
Effect of Pt additions on the sulfur segregation, vold formation and oxide scale growth of cast nickel aluminides
Cadoret Y, Bacos MP, Josso P, Maurice V, Marcus P, Zanna S
Materials Science Forum, 461-464, 247, 2004 |
