| 1 |
Using high numerical aperture objective lens in micro-reflectance difference spectrometer
Shen WF, Hu CG, Li S, Hu XT
Applied Surface Science, 421, 535, 2017 |
| 2 |
Monitoring of (reactive) ion etching (RIE) with reflectance anisotropy spectroscopy (RAS) equipment
Barzen L, Richter J, Fouckhardt H, Wahl M, Kopnarsk M
Applied Surface Science, 328, 120, 2015 |
| 3 |
A liquid crystal variable retarder-based reflectance difference spectrometer for fast, high precision spectroscopic measurements
Hu CG, Xie PF, Huo SC, Li YN, Hu XT
Thin Solid Films, 571, 543, 2014 |
| 4 |
Monitoring preparation and phase transitions of carburized W(110) by reflectance difference spectroscopy
Bachmann M, Memmel N, Bertel E, Denk M, Hohage M, Zeppenfeld P
Applied Surface Science, 258(24), 10123, 2012 |
| 5 |
Surface science studies including low-temperature RDS on MOCVD-prepared, As-terminated Si(100) surfaces
Bork T, McMahon WE, Olson JM, Hannappel T
Journal of Crystal Growth, 298, 54, 2007 |
| 6 |
Monitoring the ordering in biomolecular films on vicinal silicon surfaces by reflectance difference/anisotropy spectroscopy
Silaghi SD, Zahn DRT
Applied Surface Science, 252(15), 5462, 2006 |
| 7 |
Si(001) surface optical anisotropies induced by pi-conjugated overlayers and oxidation
Schmidt WG, Hermann A, Fuchs F, Bechstedt F
Current Applied Physics, 6(3), 525, 2006 |
| 8 |
Improved structure and performance of the GaAsSb/InP interface in a resonant tunneling diode
Kollonitsch Z, Schimper HJ, Seidel U, Moller K, Neumann S, Tegude FJ, Willig F, Hannappel T
Journal of Crystal Growth, 287(2), 536, 2006 |
| 9 |
Characterization of optical anisotropy in oriented poly(ethylene terephthalate) films using reflectance difference spectroscopy
Schmidegg K, Sun LD, Maier GA, Keckes J, Zeppenfeld P
Polymer, 47(13), 4768, 2006 |
| 10 |
Interface-related in-plane optical anisotropy of quantum wells studied by reflectance-difference spectroscopy
Chen YH, Ye XL, Xu B, Zeng YP, Wang ZG
Materials Science Forum, 475-479, 1777, 2005 |
