검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Crystallographic texture study of pulsed laser deposited Cr2O3 thin films Panda AK, Singh A, Divakar R, Krishna NG, Reddy VR, Thirumurugesan R, Murugesan S, Parameswaran P, Mohandas E Thin Solid Films, 660, 328, 2018 |
| 2 |
Effects of surface reconstruction on the epitaxial growth of III-Sb on GaAs using interfacial misfit array Jia BW, Tan KH, Loke WK, Wicaksono S, Yoon SF Applied Surface Science, 399, 220, 2017 |
| 3 |
High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure Lazarev S, Bauer S, Forghani K, Barchuk M, Scholz F, Baumbach T Journal of Crystal Growth, 370, 51, 2013 |
| 4 |
High-resolution X-ray diffraction analysis of InGaAs/AlAsSb coupled double quantum wells grown by molecular beam epitaxy Mozume T, Gozu S Journal of Crystal Growth, 311(7), 1707, 2009 |
| 5 |
Determination of lattice parameters of SiGe/Si(110) heterostructures Arimoto K, Yamanaka J, Nakagawa K, Sawano K, Shiraki Y, Koh S, Usami N Thin Solid Films, 508(1-2), 132, 2006 |
| 6 |
Fitting of reciprocal space maps of thin films with texture and stress Simek D, Kuzel R, Kub J, Kunc F Materials Science Forum, 443-4, 163, 2004 |
| 7 |
Morphology and relaxation in InyGa1-yAs/GaAs multi-layer structures Gray AL, Stintz A, Malloy KJ, Newell TC, Lester LF Journal of Crystal Growth, 222(4), 726, 2001 |
| 8 |
Influence of ultra-thin YSZ layer on heteroepitaxial CeO2/YSZ/Si(001) films analyzed by X-ray reciprocal space map Chen CH, Saiki A, Wakiya N, Shinozaki K, Mizutani N Journal of Crystal Growth, 219(3), 253, 2000 |
| 9 |
Epitaxy of (106)-oriented SrBi2Ta2O9 and SrBi2Nb2O9 thin films Nagahama T, Manabe T, Yamaguchi I, Kumagai T, Tsuchiya T, Mizuta S Thin Solid Films, 353(1-2), 52, 1999 |