검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Density gradient in SiO2 films on silicon as revealed by positron annihilation spectroscopy Revesz AG, Anwand W, Brauer G, Hughes HL, Skorupa W Applied Surface Science, 194(1-4), 101, 2002 |
| 2 |
Hydrogen in buried SiO2 layers Revesz AG, Stahlbush RE, Hughes HL Journal of the Electrochemical Society, 147(11), 4279, 2000 |
| 3 |
Structural rearrangement of SiO2 films during their growth and annealing Revesz AG Journal of the Electrochemical Society, 146(6), 2225, 1999 |
| 4 |
Oxygen vacancies in SiO2, layers an Si produced at high temperature Afanas'ev VV, Stesmans A, Revesz AG, Hughes HL Journal of the Electrochemical Society, 145(9), 3157, 1998 |
| 5 |
Trap Generation in Buried Oxides of Silicon-on-Insulator Structures by Vacuum-Ultraviolet Radiation Afanasev VV, Stesmans A, Revesz AG, Hughes HL Journal of the Electrochemical Society, 144(2), 749, 1997 |
| 6 |
Conducting and Charge-Trapping Defects in Buried Oxide Layers of Simox Structures Afanasev VV, Brown GA, Hughes HL, Liu ST, Revesz AG Journal of the Electrochemical Society, 143(1), 347, 1996 |
| 7 |
Confinement Phenomena in Buried Oxides of Simox Structures as Affected by Processing Afanasev VV, Revesz AG, Hughes HL Journal of the Electrochemical Society, 143(2), 695, 1996 |
| 8 |
Charge Instability of Bonded Silicon Dioxide Layer Induced by Wet-Processing Afanasev VV, Revesz AG, Brown GA, Hughes HL Journal of the Electrochemical Society, 142(6), 1983, 1995 |
| 9 |
Deep and Shallow Electron Trapping in the Buried Oxide Layer of Simox Structures Afanasev VV, Revesz AG, Brown GA, Hughes HL Journal of the Electrochemical Society, 141(10), 2801, 1994 |