검색결과 : 19건
| No. | Article |
|---|---|
| 1 |
Importance of Mueller matrix characterization of bianisotropic metamaterials Guth N, Varault S, Grand J, Guida G, Bonod N, Gallas B, Rivory J Thin Solid Films, 571, 405, 2014 |
| 2 |
Nanostructured chiral silver thin films: A route to metamaterials at optical frequencies Gallas B, Guth N, Rivory J, Arwin H, Magnusson R, Guida G, Yang J, Robbie K Thin Solid Films, 519(9), 2650, 2011 |
| 3 |
Interfacial diffusion effect on phase transitions in Al/Mn multilayered thin films Srivastava AK, Yu-Zhang K, Kilian L, Frigerio JM, Rivory J Journal of Materials Science, 42(1), 185, 2007 |
| 4 |
Determination of pore size distribution in thin organized mesoporous silica films by spectroscopic ellipsometry in the visible and infrared range Bourgeois A, Bruneau AB, Fisson S, Demarets B, Grosso D, Cagnol F, Sanchez C, Rivory J Thin Solid Films, 447, 46, 2004 |
| 5 |
Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry Brunet-Bruneau A, Besson S, Gacoin T, Boilot JP, Rivory J Thin Solid Films, 447, 51, 2004 |
| 6 |
Dielectric function of Si nanocrystals embedded in SiO2 Gallas B, Kao CC, Defranoux C, Fisson S, Vuye G, Rivory J Thin Solid Films, 455-56, 335, 2004 |
| 7 |
Description of the porosity of inhomogeneous porous low-k films using solvent adsorption studied by spectroscopic ellipsometry in the visible range Bourgeois A, Bruneau AB, Jousseaume V, Rochat N, Fisson S, Demarets B, Rivory J Thin Solid Films, 455-56, 366, 2004 |
| 8 |
An in situ study of mesostructured CTAB-silica film formation using infrared ellipsometry: evolution of water content Brunet-Bruneau A, Bourgeois A, Cagnol F, Grosso D, Sanchez C, Rivory J Thin Solid Films, 455-56, 656, 2004 |
| 9 |
Laser annealing of SiOx thin films Gallas B, Kao CC, Fisson S, Vuye G, Rivory J, Bernard Y, Belouet C Applied Surface Science, 185(3-4), 317, 2002 |
| 10 |
Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition Leprince-Wang Y, Souche D, Yu-Zhang K, Fisson S, Vuye G, Rivory J Thin Solid Films, 359(2), 171, 2000 |