화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 An Atomic-Force Microscopy Study on the Roughness of Silicon-Wafers Correlated with Direct Wafer Bonding
Roberds BE, Farrens SN
Journal of the Electrochemical Society, 143(7), 2365, 1996
2 Chemical Free Room-Temperature Wafer to Wafer Direct Bonding
Farrens SN, Dekker JR, Smith JK, Roberds BE
Journal of the Electrochemical Society, 142(11), 3949, 1995
3 A Kinetics Study of the Bond Strength of Direct-Bonded Wafers
Farrens SN, Hunt CE, Roberds BE, Smith JK
Journal of the Electrochemical Society, 141(11), 3225, 1994