검색결과 : 3건
No. | Article |
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1 |
Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories Seo SH, Kim SW, Lee JU, Kang GC, Roh KS, Kim KY, Lee SY, Choi CM, Song KJ, Park SR, Park JH, Jeon KC, Kim DM, Kim DH, Shin H, Lee JD, Park BG Solid-State Electronics, 52(6), 844, 2008 |
2 |
The Nonstoichiometry and Physical-Properties of the Nd1-Xca1+xfeo4-Y System Roh SG, Roh KS, Yo CH Journal of Materials Science, 31(10), 2641, 1996 |
3 |
Nonstoichiometry and Physical-Properties of the Perovskite Baxla1-Xfeo3-Y System Roh KS, Ryu KH, Yo CH Journal of Materials Science, 30(5), 1245, 1995 |